YieldManager is a deep submicron customizable, hardware-independent yield management software system which includes integrated application modules that enable engineers to collect, correlate, analyze, and graphically display and report the essential fab data and determine the significant sources of semiconductor yield loss early in the manufacturing process.
Knights YeldManager system brings critical fab data, lot history from WIP tracking systems, functional test results, inspection results, electrical test data, and the design layout together to help determine which process zones or tools are most significantly contributing to yield on a real-time basis. YieldManager software performs a number of background functions which enable automatic gathering, sorting, classification and selection of defect sets based on user-defined criteria. YieldManager automatically pre-processes the data for further analysis using the following powerful routines: partitioning, cluster analysis, repeater defect detection, sample selection, SPC system link, and a graphical user interface. YieldManager links to Knights' MegaLab® and Merlin's Framework™ software for defect review.
The YieldManager tool is an open- architecture , client/server system using the TCP/IP protocol and EtherNet connections to enable interconnectivity and enterprise-wide computing throughout the fab and among manufacturing facilities. YieldManager's open architecture enables easy connectivity with various fab equipment from multiple suppliers and worldwide sharing of yield data among a manufacturer's various wafer fabs.
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