TLP/VF-TLP

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CELESTRON-I TRANSMISSION LINE PULSER

The Celestron-I is a two terminal bench top system for fast, accurate, reliable, and affordable characterization of advanced semiconductor structures. The standard features and available options make the Celestron-I the most flexible tool for the characterization of semiconductor structures available. The system can be configured for TLP, VF-TLP, HBM ESD, and MM ESD for testing at the wafer level and/or the package level. Optional probes can also be used to measure signals on pins or pads other than the ones being stressed.

The system software is the most comprehensive in the industry and uses graphics to assist in system setup and

connection to the DUT. It displays the recorded TLP pulse voltage and current waveforms, compiled pulsed I-V curve, leakage current measurements, and DC I-V curve trace. The operator can select the range of test voltages (stress pulses), pulse polarity, leakage and curve trace parameters. The user can select the position and duration of the measurement window within the TLP pulse and modify these settings after the data is collected. Click here for datasheet or click here for a list of Frequently Asked Questions.