Oryx's ESD test systems are widely used for determining the electrostatic sensitivity of semiconductor devices and discrete components. The System 700 provides an affordable, versatile means of accurately testing such devices for ESD sensitivity. Applications range from characterization and qualification to failure analysis.

　Simplified set-up and operation make the System 700 ideal for many different test environments. Test labs can achieve high throughput with easy set up while failure analysis can be completed quickly and

effectively. Interchangeable pulse modules are available to simulate various ESD events. The 700 comes standard with a 48-pin DIP DUT interface board. Custom boards are available for a wide variety of semiconductor devices.

　Features of the 700 include HBM testing to 16kV, connections for external bias and curve-trace for leakage characterization, optional wafer level HBM testing, and optional MM testing. Click here for datasheet.